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SCSAM Service Center   (SCSAM)
Director(s): Dr. Amir Avishai
Prof. Frank Ernst
Technical Contact(s): Dr. Danqi Wang
Dr. Jonathan Cowen
Dr. Kevin Abbasi
Nan Avishai
Richard Tomazin
Admin Contact(s): Sharon Dingess
Phone: 216.368.3868
SCSAM is one of Case Western Reserve University’s largest core facilities, providing a variety of instrumentation for the microstructural and compositional characterization of materials as well as surface and near-surface chemical analysis. The Center equipment is complemented by a staff of professionals that are available to assist and train academic, research and commercial users. Fully trained users are permitted independent access to the lab, while users with particularly difficult samples or those that are unsure how to obtain the most useful data can employ the services of a staff expert. Some of the routine services offered include guidance with sample preparation, technical assistance to obtain data, and data analysis.
School or College / Location Affiliations
School/College: Case School of Engineering
Location(s):Glennan Building Room 101 and White Building Rooms 318, 307, 612A/B
Services Equipment
1) Scanning electron microscopy (SEM) / Focused ion beam (FIB)
2) Energy dispersive spectroscopy (EDS)
3) Electron backscatter diffraction (EBSD) / Transmission Kikuchi diffraction (TKD)
4) Transmission electron microscopy (TEM)
5) Scanning transmission electron microscopy (STEM)
6) Energy filtered transmission electron microscopy (EFTEM)
7) Electron energy loss spectroscopy (EELS)
8) Scanning auger spectroscopy
9) X-ray photoelectron spectroscopy (XPS)
10) Time-of-flight secondary ion mass spectrometry (TOF-SIMS)
11) X-ray diffraction (XRD)
12) Atomic force microscopy (AFM) / Magnetic force microscopy (MFM)
13) Light microscopy
14) Ion polishing sample preparation
15) TEM sample preparation
16) SEM sample preparation
17) Optical sample preparation
1) FEI Quanta 3D (Environmental SEM/FIB) / Thermo Scientific Noran EDS 30 sq. mm
2) FEI Helios 650 Nanolab (HRSEM/FIB) / Oxford EDS X- Max 80 sq mm
3) FEI Nova 200 Nanolab (SEM/FIB) / Oxford EDS X- Max 50 sq mm + HKL EBSD
4) FEI Tecnai F30 300 keV TEM / Oxford EDS X- Max 100 sq. mm / Gatan GIF 2002 / ASTAR
5) PHI TRIFT V nano time-of-flight secondary ion mass spectrometry (TOF-SIMS)
6) PHI 680 scanning auger microprobe
7) PHI VersaProbe x-ray photoelectron spectroscope (XPS)
8) Olympus FV-1000 laser scanning confocal optical microscope
9) Rigaku x-ray diffraction (XRD)
10) Veeco DI atomic force microscope (AFM) with Hysitron nano-indenter
11) Agilent G200 nano-indenter
12) Fischione 1040 nano-mill
13) Gatan Ilion ion polishing system
14) Gatan precision ion polishing system (PIPS)
15) Gatan dimpler
16) Bruker D-8, 2D (XRD)
17) Bruker D-8, 1D, 0D (XRD)
18) Keyence VHX 5000 digital optical microscope
Service Available To:No Limitations
Priority Service For:No Distinctions
Additional Access Info:
Categories & Keywords
Categories: Characterization
Keywords: HRSEM , MFM , R&D , Research & development , OIM , 3D EM , AFM , Auger , Avizo , Chemical analysis , Confocal , EBSD , EDS , EELS , EM , ESCA , Failure analysis , FIB , HRTEM , Materials characterization , Nano-indenter , Quality control , SEM , STEM , ESEM , TEM , TKD , TOF-SIMS , XPS , XRD
Last Update: 08/16/2016